Book #42841
Semiconductor Material and Device Characterization - 1st Edition/1st Printing
Binding: Hardcover
Book Condition: Near Fine in Near Fine dust jacket
Edition: First Edition; First Printing
Publisher: New York: John Wiley & Sons, Inc., 1990.
ISBN: 0471511048
Semiconductor Material and Device Characterization - 1st Edition/1st Printing
A handsome first edition/first printing in Near Fine condition with previous owner's signature to front flyleaf in alike dust-jacket with light edgewear. [i-iv] v-vii [viii] ix-xv [xvi-xviii], 1-599 [600-6] pages.
Book is written for graduate students and industrial researchers who want to learn more about the wide spectrum of measurement methods found in the modern semiconductor industry ; 8vo.
Price: $60.00
